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Electron beam-induced changes in vitreous sections of biological samples
N Sartori Blanc1, D Studer, K Ruhl
1Laboratoire d'Analyse Ultrastructurale, Bâtiment de Biologie, Université de Lausanne, Switzerland.
Journal of Microscopy
|December 16, 1998
Summary
Electron irradiation of cryosectioned biological samples like Zea mays and human cells can erase cutting artifacts and improve organelle visibility. However, this apparent enhancement is a beam-induced artifact, causing differential shrinkage and loss of high-resolution data.
Area of Science:
- Cryo-electron microscopy
- Biological sample preparation
- Electron beam interactions
Background:
- High pressure freezing and cryosectioning are crucial for preserving biological ultrastructure.
- Electron irradiation can induce changes in biological specimens during microscopy.
- Understanding these changes is vital for accurate interpretation of cryo-electron microscopy data.
Purpose of the Study:
- To investigate the effects of electron irradiation on cryosectioned biological samples.
- To assess the impact of electron doses on sample integrity and image quality.
- To differentiate between genuine structural features and beam-induced artifacts.
Main Methods:
- Cryosectioning of nonpretreated high pressure frozen samples (Zea mays, cartilage, human erythrocytes).
- Observation at 110K in a cryoelectron microscope.
- Exposure to medium doses of electron irradiation (< 10 ke nm-2).
Main Results:
- Electron irradiation (< 10 ke nm-2) reduced cutting artifacts, enhancing organelle visibility.
- Irradiation induced shrinkage in the cutting direction, dependent on section support.
- Differential shrinkage occurred in mitochondria, chromatin, and nucleoli, improving gross structure visibility.
- This apparent improvement was identified as a beam-induced artifact, accompanied by a loss of high-resolution information.
Conclusions:
- Electron irradiation can paradoxically improve the appearance of cryosectioned biological samples by reducing artifacts.
- The observed improvements are artifacts due to differential shrinkage, not genuine structural changes.
- Researchers must be aware of these beam-induced artifacts to avoid misinterpretation of high-resolution cryo-electron microscopy data.