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New Rotational Analysis of the B2Sigma+-X2Sigma+ Bands in 69Ga16O and 71Ga16O
Vujisi&cacute1, Antić-Jovanovi&cacute, Bojovi&cacute
1Physical Chemistry Laboratory, Institute of Nuclear Sciences-Vinca, Belgrade, 11001, Yugoslavia
Journal of Molecular Spectroscopy
|May 18, 1999
Abstract:
In the emission spectrum of the Ga16O molecule, the 0-0 and 1-0 bands of the B-X system have been rephotographed by means of conventional high-resolution spectroscopy. Clear resolution on the rotational structure near the band origins made it possible to perform reanalysis of the bands and derive new molecular constants characterizing 69Ga16O and 71Ga16O in the B2Sigma+ and X2Sigma+ states. Copyright 1999 Academic Press.