Conductivity and structure of thin oxide layers grown on a metal substrate: Scanning-tunneling microscopy in NiO on Ni(100)

Tuning Oxide Properties by Oxygen Vacancy Control During Growth and Annealing

Published on: June 9, 2023

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015