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Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
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High-field electron-drift measurements and the mobility edge in hydrogenated amorphous silicon

Gu, Schiff, Chévrier

    Physical Review. B, Condensed Matter
    |August 15, 1995
    PubMed
    Abstract

    No abstract available in PubMed .

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