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Updated: Oct 25, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Direct determination of exact charge states of surface point defects using scanning tunneling microscopy: As

Chao, Smith, Shih

    Physical Review. B, Condensed Matter
    |March 15, 1996
    PubMed
    Abstract

    No abstract available in PubMed .

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