Related Experiment Video

Updated: Jul 28, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Optical absorption spectroscopy of Si-Ge alloys and superlattices

Pearsall, Polatoglou, Presting

    Physical Review. B, Condensed Matter
    |July 15, 1996
    PubMed
    Abstract

    No abstract available in PubMed .

    More Related Videos

    Quantitative Analysis of Vacuum Induction Melting by Laser-induced Breakdown Spectroscopy03:49

    Quantitative Analysis of Vacuum Induction Melting by Laser-induced Breakdown Spectroscopy

    Published on: June 10, 2019

    Using Laser Scanning Microscopy to Determine Electromigration in Molybdenum Disilicide09:41

    Using Laser Scanning Microscopy to Determine Electromigration in Molybdenum Disilicide

    Published on: May 23, 2025

    Related Concept Videos

    Atomic Spectroscopy: Absorption, Emission, and Fluorescence01:23

    Atomic Spectroscopy: Absorption, Emission, and Fluorescence

    Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...