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A Béché

Showing results (1-10 of 16) with videos related to

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Physical Review Letters|November 10, 2015
Electron Microscopy of Probability Currents at Atomic ResolutionA Lubk, A Béché, J Verbeeck
Ultramicroscopy|May 26, 2016
Efficient creation of electron vortex beams for high resolution STEM imagingA Béché, R Juchtmans, J Verbeeck
Ultramicroscopy|June 3, 2020
Evaluation of different rectangular scan strategies for STEM imagingA Velazco, M Nord, A Béché, et al.
Ultramicroscopy|June 18, 2022
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage processD Jannis, A Velazco, A Béché, et al.
Ultramicroscopy|October 16, 2021
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findingsA Velazco, A Béché, D Jannis, et al.
Ultramicroscopy|February 22, 2011
Dark field electron holography for strain measurementA Béché, J L Rouvière, J P Barnes, et al.
Ultramicroscopy|May 16, 2013
Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holographyA Béché, J L Rouvière, J P Barnes, et al.
Micron (Oxford, England : 1993)|October 4, 2015
Focused electron beam induced deposition as a tool to create electron vorticesA Béché, R Winkler, H Plank, et al.
Ultramicroscopy|September 8, 2020
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscaleV Prabhakara, D Jannis, G Guzzinati, et al.
Ultramicroscopy|November 27, 2021
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applicationsD Jannis, C Hofer, C Gao, et al.
Pageof 2

Showing results (1-10 of 16) with videos related to

Sort By:
Pageof 2
Physical Review Letters|November 10, 2015
Electron Microscopy of Probability Currents at Atomic ResolutionA Lubk, A Béché, J Verbeeck
Ultramicroscopy|May 26, 2016
Efficient creation of electron vortex beams for high resolution STEM imagingA Béché, R Juchtmans, J Verbeeck
Ultramicroscopy|June 3, 2020
Evaluation of different rectangular scan strategies for STEM imagingA Velazco, M Nord, A Béché, et al.
Ultramicroscopy|June 18, 2022
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage processD Jannis, A Velazco, A Béché, et al.
Ultramicroscopy|October 16, 2021
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findingsA Velazco, A Béché, D Jannis, et al.
Ultramicroscopy|February 22, 2011
Dark field electron holography for strain measurementA Béché, J L Rouvière, J P Barnes, et al.
Ultramicroscopy|May 16, 2013
Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holographyA Béché, J L Rouvière, J P Barnes, et al.
Micron (Oxford, England : 1993)|October 4, 2015
Focused electron beam induced deposition as a tool to create electron vorticesA Béché, R Winkler, H Plank, et al.
Ultramicroscopy|September 8, 2020
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscaleV Prabhakara, D Jannis, G Guzzinati, et al.
Ultramicroscopy|November 27, 2021
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applicationsD Jannis, C Hofer, C Gao, et al.
Pageof 2