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A De Vault

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Biometrics|December 1, 1993

Estimating incidence and diagnostic error rates for bivariate progressive processesM A Espeland, J T Rushing, A De Vault

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Search research articles

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Biometrics|December 1, 1993

Estimating incidence and diagnostic error rates for bivariate progressive processesM A Espeland, J T Rushing, A De Vault

Pageof 1