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A Delcorte

Showing results (1-10 of 13) with videos related to

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Analytical Chemistry|April 2, 2005
Metal salts for molecular ion yield enhancement in organic secondary ion mass spectrometry: a critical assessmentA Delcorte, P Bertrand
Analytical Chemistry|October 17, 2002
Organic secondary ion mass spectrometry: sensitivity enhancement by gold depositionA Delcorte, N Médard, P Bertrand
Analytical Chemistry|March 27, 2010
Dynamics of molecular impacts on soft materials: from fullerenes to organic nanodropsA Delcorte, B J Garrison, K Hamraoui
Accounts of Chemical Research|March 29, 2000
Molecule liftoff from surfacesB J Garrison, A Delcorte, K D Krantzman
Journal of Materials Science. Materials in Medicine|December 29, 2011
Double protein functionalized poly-ε-caprolactone surfaces: in depth ToF-SIMS and XPS characterizationT Desmet, C Poleunis, A Delcorte, et al.
The Journal of Physical Chemistry. B|March 31, 2006
Understanding gold-thiolate cluster emission from self-assembled monolayers upon kiloelectronvolt ion bombardmentB Arezki, A Delcorte, B J Garrison, et al.
Analytical Chemistry|December 13, 2003
Sample metallization for performance improvement in desorption/ionization of kilodalton molecules: quantitative evaluation, imaging secondary ion MS, and laser ablationA Delcorte, J Bour, F Aubriet, et al.
Analytical and Bioanalytical Chemistry|November 21, 2013
Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayersN Wehbe, T Mouhib, A Delcorte, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|July 11, 2019
Atmospheric Pressure Plasma Deposition of Hydrophilic/Phobic Patterns and Thin Film Laminates on Any SurfaceA Demaude, C Poleunis, E Goormaghtigh, et al.
The Analyst|September 24, 2013
Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beamsT Mouhib, C Poleunis, N Wehbe, et al.
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Analytical Chemistry|April 2, 2005
Metal salts for molecular ion yield enhancement in organic secondary ion mass spectrometry: a critical assessmentA Delcorte, P Bertrand
Analytical Chemistry|October 17, 2002
Organic secondary ion mass spectrometry: sensitivity enhancement by gold depositionA Delcorte, N Médard, P Bertrand
Analytical Chemistry|March 27, 2010
Dynamics of molecular impacts on soft materials: from fullerenes to organic nanodropsA Delcorte, B J Garrison, K Hamraoui
Accounts of Chemical Research|March 29, 2000
Molecule liftoff from surfacesB J Garrison, A Delcorte, K D Krantzman
Journal of Materials Science. Materials in Medicine|December 29, 2011
Double protein functionalized poly-ε-caprolactone surfaces: in depth ToF-SIMS and XPS characterizationT Desmet, C Poleunis, A Delcorte, et al.
The Journal of Physical Chemistry. B|March 31, 2006
Understanding gold-thiolate cluster emission from self-assembled monolayers upon kiloelectronvolt ion bombardmentB Arezki, A Delcorte, B J Garrison, et al.
Analytical Chemistry|December 13, 2003
Sample metallization for performance improvement in desorption/ionization of kilodalton molecules: quantitative evaluation, imaging secondary ion MS, and laser ablationA Delcorte, J Bour, F Aubriet, et al.
Analytical and Bioanalytical Chemistry|November 21, 2013
Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayersN Wehbe, T Mouhib, A Delcorte, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|July 11, 2019
Atmospheric Pressure Plasma Deposition of Hydrophilic/Phobic Patterns and Thin Film Laminates on Any SurfaceA Demaude, C Poleunis, E Goormaghtigh, et al.
The Analyst|September 24, 2013
Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beamsT Mouhib, C Poleunis, N Wehbe, et al.
Pageof 2