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A E Pestov

Showing results (1-10 of 15) with videos related to

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Voenno-Meditsinskii Zhurnal|October 1, 1976
[Occupational training of naval physicians at the level of contemporary demands]A E Pestov
Voenno-Meditsinskii Zhurnal|October 1, 1977
[Work experience with the morale and psychological training of personnel]A E Pestov, N G Golubev, A I Vasilevskiĭ
Voenno-Meditsinskii Zhurnal|April 1, 1977
[Importance of rest between cruises]A E Pestov, A I Vasilevskiĭ, G D Leliukh
Optics Express|October 17, 2014
Roughness measurement and ion-beam polishing of super-smooth optical surfaces of fused quartz and optical ceramicsN I Chkhalo, S A Churin, A E Pestov, et al.
The Review of Scientific Instruments|July 3, 2015
Sub-micrometer resolution proximity X-ray microscope with digital image registrationN I Chkhalo, A E Pestov, N N Salashchenko, et al.
Applied Optics|April 26, 2022
Influence of ion-beam etching by Ar ions with an energy of 200-1000  eV on the roughness and sputtering yield of a single-crystal silicon surfaceM S Mikhailenko, A E Pestov, N I Chkhalo, et al.
Applied Optics|February 25, 2016
Ion-beam polishing of fused silica substrates for imaging soft x-ray and extreme ultraviolet opticsN I Chkhalo, S A Churin, M S Mikhaylenko, et al.
Applied Optics|February 3, 2016
Problems in the application of a null lens for precise measurements of aspheric mirrorsN I Chkhalo, I V Malyshev, A E Pestov, et al.
Applied Optics|August 22, 2018
Polishing the surface of a z-cut KDP crystal by neutralized argon ionsN I Chkhalo, A V Kirsanov, G A Luchinin, et al.
Journal of X-Ray Science and Technology|July 9, 2019
X-ray scattering by the fused silica surface etched by low-energy Ar ionsM M Barysheva, N I Chkhalo, M N Drozdov, et al.
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
Voenno-Meditsinskii Zhurnal|October 1, 1976
[Occupational training of naval physicians at the level of contemporary demands]A E Pestov
Voenno-Meditsinskii Zhurnal|October 1, 1977
[Work experience with the morale and psychological training of personnel]A E Pestov, N G Golubev, A I Vasilevskiĭ
Voenno-Meditsinskii Zhurnal|April 1, 1977
[Importance of rest between cruises]A E Pestov, A I Vasilevskiĭ, G D Leliukh
Optics Express|October 17, 2014
Roughness measurement and ion-beam polishing of super-smooth optical surfaces of fused quartz and optical ceramicsN I Chkhalo, S A Churin, A E Pestov, et al.
The Review of Scientific Instruments|July 3, 2015
Sub-micrometer resolution proximity X-ray microscope with digital image registrationN I Chkhalo, A E Pestov, N N Salashchenko, et al.
Applied Optics|April 26, 2022
Influence of ion-beam etching by Ar ions with an energy of 200-1000  eV on the roughness and sputtering yield of a single-crystal silicon surfaceM S Mikhailenko, A E Pestov, N I Chkhalo, et al.
Applied Optics|February 25, 2016
Ion-beam polishing of fused silica substrates for imaging soft x-ray and extreme ultraviolet opticsN I Chkhalo, S A Churin, M S Mikhaylenko, et al.
Applied Optics|February 3, 2016
Problems in the application of a null lens for precise measurements of aspheric mirrorsN I Chkhalo, I V Malyshev, A E Pestov, et al.
Applied Optics|August 22, 2018
Polishing the surface of a z-cut KDP crystal by neutralized argon ionsN I Chkhalo, A V Kirsanov, G A Luchinin, et al.
Journal of X-Ray Science and Technology|July 9, 2019
X-ray scattering by the fused silica surface etched by low-energy Ar ionsM M Barysheva, N I Chkhalo, M N Drozdov, et al.
Pageof 2