A H Carim - JoVE Visualize

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Science (New York, N.Y.)|August 7, 1987

High-resolution electron microscopy and scanning tunneling microscopy of native oxides on siliconA H Carim, M M Dovek, C F Quate, et al.

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Science (New York, N.Y.)|August 7, 1987

High-resolution electron microscopy and scanning tunneling microscopy of native oxides on siliconA H Carim, M M Dovek, C F Quate, et al.

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