Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

A Kobler

Showing results (1-10 of 4) with videos related to

Pageof 1
Sort By:
Ultramicroscopy|December 25, 2016
Challenges in quantitative crystallographic characterization of 3D thin films by ACOM-TEMA Kobler, C Kübel
Ultramicroscopy|March 26, 2013
Combination of in situ straining and ACOM TEM: a novel method for analysis of plastic deformation of nanocrystalline metalsA Kobler, A Kashiwar, H Hahn, et al.
Physical Review Letters|January 17, 2012
Strain relaxation and vacancy creation in thin platinum filmsW Gruber, S Chakravarty, C Baehtz, et al.
Ultramicroscopy|August 1, 2016
Comprehensive analysis of TEM methods for LiFePO<sub>4</sub>/FePO<sub>4</sub> phase mapping: spectroscopic techniques (EFTEM, STEM-EELS) and STEM diffraction techniques (ACOM-TEM)X Mu, A Kobler, D Wang, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|December 25, 2016
Challenges in quantitative crystallographic characterization of 3D thin films by ACOM-TEMA Kobler, C Kübel
Ultramicroscopy|March 26, 2013
Combination of in situ straining and ACOM TEM: a novel method for analysis of plastic deformation of nanocrystalline metalsA Kobler, A Kashiwar, H Hahn, et al.
Physical Review Letters|January 17, 2012
Strain relaxation and vacancy creation in thin platinum filmsW Gruber, S Chakravarty, C Baehtz, et al.
Ultramicroscopy|August 1, 2016
Comprehensive analysis of TEM methods for LiFePO<sub>4</sub>/FePO<sub>4</sub> phase mapping: spectroscopic techniques (EFTEM, STEM-EELS) and STEM diffraction techniques (ACOM-TEM)X Mu, A Kobler, D Wang, et al.
Pageof 1