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A Lastras-Martínez

Showing results (1-10 of 5) with videos related to

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Applied Optics|October 22, 2009
Microreflectance difference spectrometer based on a charge coupled device camera: surface distribution of polishing-related linear defect density in GaAs (001)L F Lastras-Martínez, R Castro-García, R E Balderas-Navarro, et al.
Physical Review Letters|February 21, 2006
Measurement of the surface strain induced by reconstructed surfaces of GaAs (001) using photoreflectance and reflectance-difference spectroscopiesL F Lastras-Martínez, J M Flores-Camacho, A Lastras-Martínez, et al.
The Review of Scientific Instruments|October 2, 2023
Data reduction for spatially resolved reflectance anisotropy spectrometerL Rodríguez-Salas, A Lastras-Martínez, O F Núñez-Olvera, et al.
The Review of Scientific Instruments|November 7, 2012
A rapid reflectance-difference spectrometer for real-time semiconductor growth monitoring with sub-second time resolutionO Núñez-Olvera, R E Balderas-Navarro, J Ortega-Gallegos, et al.
Applied Optics|May 14, 2020
Real-time reflectance anisotropy spectroscopy of GaAs homoepitaxyA Lastras-Martínez, L E Guevara-Macías, J G Santiago-García, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Applied Optics|October 22, 2009
Microreflectance difference spectrometer based on a charge coupled device camera: surface distribution of polishing-related linear defect density in GaAs (001)L F Lastras-Martínez, R Castro-García, R E Balderas-Navarro, et al.
Physical Review Letters|February 21, 2006
Measurement of the surface strain induced by reconstructed surfaces of GaAs (001) using photoreflectance and reflectance-difference spectroscopiesL F Lastras-Martínez, J M Flores-Camacho, A Lastras-Martínez, et al.
The Review of Scientific Instruments|October 2, 2023
Data reduction for spatially resolved reflectance anisotropy spectrometerL Rodríguez-Salas, A Lastras-Martínez, O F Núñez-Olvera, et al.
The Review of Scientific Instruments|November 7, 2012
A rapid reflectance-difference spectrometer for real-time semiconductor growth monitoring with sub-second time resolutionO Núñez-Olvera, R E Balderas-Navarro, J Ortega-Gallegos, et al.
Applied Optics|May 14, 2020
Real-time reflectance anisotropy spectroscopy of GaAs homoepitaxyA Lastras-Martínez, L E Guevara-Macías, J G Santiago-García, et al.
Pageof 1