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A Lubk

Showing results (11-20 of 15) with videos related to

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Physical Review Letters|September 26, 2012
Evidence of sharp and diffuse domain walls in BiFeO3 by means of unit-cell-wise strain and polarization maps obtained with high resolution scanning transmission electron microscopyA Lubk, M D Rossell, J Seidel, et al.
Nature Materials|October 18, 2011
Flexoelectric rotation of polarization in ferroelectric thin filmsG Catalan, A Lubk, A H G Vlooswijk, et al.
Physical Review Letters|June 9, 2018
Induction Mapping of the 3D-Modulated Spin Texture of Skyrmions in Thin HelimagnetsS Schneider, D Wolf, M J Stolt, et al.
Nature Communications|June 10, 2022
Tailoring electron beams with high-frequency self-assembled magnetic charged particle micro opticsR Huber, F Kern, D D Karnaushenko, et al.
The Journal of Physical Chemistry Letters|July 15, 2021
Layered van der Waals Topological Metals of TaTMTe<sub>4</sub> (TM = Ir, Rh, Ru) FamilyG Shipunov, B R Piening, C Wuttke, et al.
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Showing results (11-20 of 15) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 15 results.
Physical Review Letters|September 26, 2012
Evidence of sharp and diffuse domain walls in BiFeO3 by means of unit-cell-wise strain and polarization maps obtained with high resolution scanning transmission electron microscopyA Lubk, M D Rossell, J Seidel, et al.
Nature Materials|October 18, 2011
Flexoelectric rotation of polarization in ferroelectric thin filmsG Catalan, A Lubk, A H G Vlooswijk, et al.
Physical Review Letters|June 9, 2018
Induction Mapping of the 3D-Modulated Spin Texture of Skyrmions in Thin HelimagnetsS Schneider, D Wolf, M J Stolt, et al.
Nature Communications|June 10, 2022
Tailoring electron beams with high-frequency self-assembled magnetic charged particle micro opticsR Huber, F Kern, D D Karnaushenko, et al.
The Journal of Physical Chemistry Letters|July 15, 2021
Layered van der Waals Topological Metals of TaTMTe<sub>4</sub> (TM = Ir, Rh, Ru) FamilyG Shipunov, B R Piening, C Wuttke, et al.
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