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Scanning|June 3, 2008
Evaluation of surface roughness and nanostructure of indium tin oxide (ITO) films by atomic force microscopyG Kavei, Y Zare, A Mohammadi GheidariUltramicroscopy|December 17, 2025
Basic considerations in the design of an electrostatic electron monochromatorM J Adriaans, J P Hoogenboom, A Mohammadi-GheidariUltramicroscopy|April 12, 2023
In multi electron beam systems, "Neighbours Matter"A Mohammadi-Gheidari, E R Kieft, X Guo, et al.Pageof 1