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A N Ramanayaka

Showing results (1-10 of 5) with videos related to

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Journal of Vacuum Science and Technology. B, Nanotechnology & Microelectronics : Materials, Processing, Measurement, & Phenomena : JVST B|July 12, 2021
Developing Single Layer MOS Quantum Dots for Diagnostic QubitsYanxue Hong, A N Ramanayaka, Ryan Stein, et al.
Physical Review Letters|May 7, 2016
Projected Dipole Moments of Individual Two-Level Defects Extracted Using Circuit Quantum ElectrodynamicsB Sarabi, A N Ramanayaka, A L Burin, et al.
Journal of Physics Communications|October 12, 2020
Targeted enrichment of <sup>28</sup>Si thin films for quantum computingK Tang, H S Kim, A N Ramanayaka, et al.
Scientific Reports|January 31, 2018
STM patterned nanowire measurements using photolithographically defined implants in Si(100)A N Ramanayaka, Hyun-Soo Kim, Ke Tang, et al.
AIP Advances|April 29, 2024
Use of quantum effects as potential qualifying metrics for "quantum grade silicon"A N Ramanayaka, Ke Tang, J A Hagmann, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Journal of Vacuum Science and Technology. B, Nanotechnology & Microelectronics : Materials, Processing, Measurement, & Phenomena : JVST B|July 12, 2021
Developing Single Layer MOS Quantum Dots for Diagnostic QubitsYanxue Hong, A N Ramanayaka, Ryan Stein, et al.
Physical Review Letters|May 7, 2016
Projected Dipole Moments of Individual Two-Level Defects Extracted Using Circuit Quantum ElectrodynamicsB Sarabi, A N Ramanayaka, A L Burin, et al.
Journal of Physics Communications|October 12, 2020
Targeted enrichment of <sup>28</sup>Si thin films for quantum computingK Tang, H S Kim, A N Ramanayaka, et al.
Scientific Reports|January 31, 2018
STM patterned nanowire measurements using photolithographically defined implants in Si(100)A N Ramanayaka, Hyun-Soo Kim, Ke Tang, et al.
AIP Advances|April 29, 2024
Use of quantum effects as potential qualifying metrics for "quantum grade silicon"A N Ramanayaka, Ke Tang, J A Hagmann, et al.
Pageof 1