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Journal of Vacuum Science and Technology. B, Nanotechnology & Microelectronics : Materials, Processing, Measurement, & Phenomena : JVST B
|
July 12, 2021
Developing Single Layer MOS Quantum Dots for Diagnostic Qubits
Yanxue Hong, A N Ramanayaka, Ryan Stein, et al.
Physical Review Letters
|
May 7, 2016
Projected Dipole Moments of Individual Two-Level Defects Extracted Using Circuit Quantum Electrodynamics
B Sarabi, A N Ramanayaka, A L Burin, et al.
Journal of Physics Communications
|
October 12, 2020
Targeted enrichment of <sup>28</sup>Si thin films for quantum computing
K Tang, H S Kim, A N Ramanayaka, et al.
Scientific Reports
|
January 31, 2018
STM patterned nanowire measurements using photolithographically defined implants in Si(100)
A N Ramanayaka, Hyun-Soo Kim, Ke Tang, et al.
AIP Advances
|
April 29, 2024
Use of quantum effects as potential qualifying metrics for "quantum grade silicon"
A N Ramanayaka, Ke Tang, J A Hagmann, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Journal of Vacuum Science and Technology. B, Nanotechnology & Microelectronics : Materials, Processing, Measurement, & Phenomena : JVST B
|
July 12, 2021
Developing Single Layer MOS Quantum Dots for Diagnostic Qubits
Yanxue Hong, A N Ramanayaka, Ryan Stein, et al.
Physical Review Letters
|
May 7, 2016
Projected Dipole Moments of Individual Two-Level Defects Extracted Using Circuit Quantum Electrodynamics
B Sarabi, A N Ramanayaka, A L Burin, et al.
Journal of Physics Communications
|
October 12, 2020
Targeted enrichment of <sup>28</sup>Si thin films for quantum computing
K Tang, H S Kim, A N Ramanayaka, et al.
Scientific Reports
|
January 31, 2018
STM patterned nanowire measurements using photolithographically defined implants in Si(100)
A N Ramanayaka, Hyun-Soo Kim, Ke Tang, et al.
AIP Advances
|
April 29, 2024
Use of quantum effects as potential qualifying metrics for "quantum grade silicon"
A N Ramanayaka, Ke Tang, J A Hagmann, et al.
Page
of 1