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A Pofelski

Showing results (1-10 of 6) with videos related to

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Ultramicroscopy|November 30, 2021
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopyA Pofelski, I Bicket, G A Botton
Ultramicroscopy|September 10, 2023
Relation between sampling, sensitivity and precision in strain mapping using the Geometric Phase Analysis method in Scanning Transmission Electron MicroscopyA Pofelski, Y Zhu, G A Botton
Ultramicroscopy|February 16, 2021
Assessment of the strain depth sensitivity of Moiré sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis through a comparison with Dark-Field Electron HolographyA Pofelski, V Whabi, S Ghanad-Tavakoli, et al.
Micron (Oxford, England : 1993)|November 21, 2016
TEM illumination settings study for optimum spatial resolution and indexing reliability in crystal orientation mappingsA Valery, A Pofelski, L Clément, et al.
Ultramicroscopy|December 30, 2019
Sampling optimization of Moiré geometrical phase analysis for strain characterization in scanning transmission electron microscopyA Pofelski, S Ghanad-Tavakoli, D A Thompson, et al.
Ultramicroscopy|February 8, 2018
2D strain mapping using scanning transmission electron microscopy Moiré interferometry and geometrical phase analysisA Pofelski, S Y Woo, B H Le, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|November 30, 2021
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopyA Pofelski, I Bicket, G A Botton
Ultramicroscopy|September 10, 2023
Relation between sampling, sensitivity and precision in strain mapping using the Geometric Phase Analysis method in Scanning Transmission Electron MicroscopyA Pofelski, Y Zhu, G A Botton
Ultramicroscopy|February 16, 2021
Assessment of the strain depth sensitivity of Moiré sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis through a comparison with Dark-Field Electron HolographyA Pofelski, V Whabi, S Ghanad-Tavakoli, et al.
Micron (Oxford, England : 1993)|November 21, 2016
TEM illumination settings study for optimum spatial resolution and indexing reliability in crystal orientation mappingsA Valery, A Pofelski, L Clément, et al.
Ultramicroscopy|December 30, 2019
Sampling optimization of Moiré geometrical phase analysis for strain characterization in scanning transmission electron microscopyA Pofelski, S Ghanad-Tavakoli, D A Thompson, et al.
Ultramicroscopy|February 8, 2018
2D strain mapping using scanning transmission electron microscopy Moiré interferometry and geometrical phase analysisA Pofelski, S Y Woo, B H Le, et al.
Pageof 1