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A R Woll

Showing results (1-10 of 6) with videos related to

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Journal of Synchrotron Radiation|May 2, 2018
Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applicationsH Joress, J D Brock, A R Woll
Physical Review Letters|February 21, 2006
Multiple time scales in diffraction measurements of diffusive surface relaxationAaron Fleet, Darren Dale, A R Woll, et al.
Physical Review Letters|April 7, 2010
Measurements of surface diffusivity and coarsening during pulsed laser depositionJ D Ferguson, G Arikan, D S Dale, et al.
The Journal of Chemical Physics|June 21, 2011
Hyperthermal organic thin film growth on surfaces terminated with self-assembled monolayers. I. The dynamics of trappingT V Desai, S Hong, A R Woll, et al.
The Journal of Chemical Physics|April 2, 2009
Coverage dependent adsorption dynamics in hyperthermal organic thin film growthA Amassian, T V Desai, S Kowarik, et al.
The Review of Scientific Instruments|October 3, 2014
Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loadingP K Lambert, C J Hustedt, K S Vecchio, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Journal of Synchrotron Radiation|May 2, 2018
Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applicationsH Joress, J D Brock, A R Woll
Physical Review Letters|February 21, 2006
Multiple time scales in diffraction measurements of diffusive surface relaxationAaron Fleet, Darren Dale, A R Woll, et al.
Physical Review Letters|April 7, 2010
Measurements of surface diffusivity and coarsening during pulsed laser depositionJ D Ferguson, G Arikan, D S Dale, et al.
The Journal of Chemical Physics|June 21, 2011
Hyperthermal organic thin film growth on surfaces terminated with self-assembled monolayers. I. The dynamics of trappingT V Desai, S Hong, A R Woll, et al.
The Journal of Chemical Physics|April 2, 2009
Coverage dependent adsorption dynamics in hyperthermal organic thin film growthA Amassian, T V Desai, S Kowarik, et al.
The Review of Scientific Instruments|October 3, 2014
Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loadingP K Lambert, C J Hustedt, K S Vecchio, et al.
Pageof 1