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Journal of X-Ray Science and Technology|February 11, 2011
An Elliptical Crystal Spectrometer Suitable for EXAFS Studies of Laser Compressed Materials and for High Resolution X-Ray SpectroscopyA Ridgeley, D Goodman, T A HallApplied Optics|February 4, 2010
Photographic sensitivity measurements in the vacuum ultravioletW M Burton, A T Hatter, A RidgeleyJournal of X-Ray Science and Technology|February 11, 2011
Soft X-Ray Contact Microscopy of Biological Specimens: Aluminum-Coated Silicon Nitride Windows as XUV FiltersA D Stead, T W Ford, J A Catcheside, et al.Applied Optics|March 18, 2010
Intercomparison of radiometric irradiance scales in the 90-250-nm wavelength rangeH Kaase, K H Stephan, W M Burton, et al.Journal of X-Ray Science and Technology|February 11, 2011
Measurement of x-ray spectral line wavelengths by using two bragg reflectionsA V Rodé, A M Maksimchuk, G V Sklizkov, et al.Pageof 1