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A Rosenauer

Showing results (1-10 of 35) with videos related to

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Rocky Mountain Medical Journal|March 1, 1970
Choroid plexus papilloma. An unusually large brain tumorA Rosenauer, A F Peterman
Ultramicroscopy|March 8, 2003
Determination of the mean inner potential in III-V semiconductors by electron holographyP Kruse, A Rosenauer, D Gerthsen
Acta Crystallographica. Section A, Foundations of Crystallography|December 22, 2011
Scattering amplitudes and static atomic correction factors for the composition-sensitive 002 reflection in sphalerite ternary III-V and II-VI semiconductorsM Schowalter, K Müller, A Rosenauer
Ultramicroscopy|June 8, 2001
Compositional analysis based on electron holography and a chemically sensitive reflectionA Rosenauer, D Van Dyck, M Arzberger, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|December 19, 2008
Computation and parametrization of the temperature dependence of Debye-Waller factors for group IV, III-V and II-VI semiconductorsM Schowalter, A Rosenauer, J T Titantah, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|April 8, 2009
Temperature-dependent Debye-Waller factors for semiconductors with the wurtzite-type structureM Schowalter, A Rosenauer, J T Titantah, et al.
Ultramicroscopy|August 30, 2005
Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holographyP Kruse, M Schowalter, D Lamoen, et al.
Ultramicroscopy|June 14, 2013
Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitationsA De Backer, G T Martinez, A Rosenauer, et al.
Ultramicroscopy|November 26, 2013
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopyG T Martinez, A Rosenauer, A De Backer, et al.
Micron (Oxford, England : 1993)|January 28, 2014
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy imagesG T Martinez, A De Backer, A Rosenauer, et al.
Pageof 4

Showing results (1-10 of 35) with videos related to

Sort By:
Pageof 4
Rocky Mountain Medical Journal|March 1, 1970
Choroid plexus papilloma. An unusually large brain tumorA Rosenauer, A F Peterman
Ultramicroscopy|March 8, 2003
Determination of the mean inner potential in III-V semiconductors by electron holographyP Kruse, A Rosenauer, D Gerthsen
Acta Crystallographica. Section A, Foundations of Crystallography|December 22, 2011
Scattering amplitudes and static atomic correction factors for the composition-sensitive 002 reflection in sphalerite ternary III-V and II-VI semiconductorsM Schowalter, K Müller, A Rosenauer
Ultramicroscopy|June 8, 2001
Compositional analysis based on electron holography and a chemically sensitive reflectionA Rosenauer, D Van Dyck, M Arzberger, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|December 19, 2008
Computation and parametrization of the temperature dependence of Debye-Waller factors for group IV, III-V and II-VI semiconductorsM Schowalter, A Rosenauer, J T Titantah, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|April 8, 2009
Temperature-dependent Debye-Waller factors for semiconductors with the wurtzite-type structureM Schowalter, A Rosenauer, J T Titantah, et al.
Ultramicroscopy|August 30, 2005
Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holographyP Kruse, M Schowalter, D Lamoen, et al.
Ultramicroscopy|June 14, 2013
Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitationsA De Backer, G T Martinez, A Rosenauer, et al.
Ultramicroscopy|November 26, 2013
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopyG T Martinez, A Rosenauer, A De Backer, et al.
Micron (Oxford, England : 1993)|January 28, 2014
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy imagesG T Martinez, A De Backer, A Rosenauer, et al.
Pageof 4