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A V Zinovev

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Rapid Communications in Mass Spectrometry : RCM|November 12, 2013
Dual-beam versus single-beam depth profiling: same sample in same instrumentS V Baryshev, N G Becker, A V Zinovev, et al.
Nanotechnology|December 11, 2012
Measuring the roughness of buried interfaces by sputter depth profilingS V Baryshev, J A Klug, A V Zinovev, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Rapid Communications in Mass Spectrometry : RCM|November 12, 2013
Dual-beam versus single-beam depth profiling: same sample in same instrumentS V Baryshev, N G Becker, A V Zinovev, et al.
Nanotechnology|December 11, 2012
Measuring the roughness of buried interfaces by sputter depth profilingS V Baryshev, J A Klug, A V Zinovev, et al.
Pageof 1