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The Journal of Chemical Physics|March 10, 2011
Electron attachment to POCl3. III. Measurement and kinetic modeling of branching fractionsNicholas S Shuman, Thomas M Miller, A A Viggiano, et al.
The Journal of Chemical Physics|January 1, 2008
Low-energy electron attachment to SF6. III. From thermal detachment to the electron affinity of SF6Albert A Viggiano, Thomas M Miller, Jeffrey F Friedman, et al.
The Journal of Chemical Physics|July 19, 2012
Analysis by kinetic modeling of the temperature dependence of thermal electron attachment to CF3BrJürgen Troe, Thomas M Miller, Nicholas S Shuman, et al.
The Journal of Chemical Physics|November 12, 2013
Communication: Transfer ionization in a thermal reaction of a cation and anion: Ar+ with Br- and I-Nicholas S Shuman, Thomas M Miller, Rainer Johnsen, et al.
The Journal of Chemical Physics|June 8, 2013
Electron attachment to CF3 and CF3Br at temperatures up to 890 K: experimental test of the kinetic modeling approachNicholas S Shuman, Thomas M Miller, Albert A Viggiano, et al.
The Journal of Chemical Physics|February 12, 2015
Mutual neutralization of atomic rare-gas cations (Ne(+), Ar(+), Kr(+), Xe(+)) with atomic halide anions (Cl(-), Br(-), I(-))Nicholas S Shuman, Thomas M Miller, Rainer Johnsen, et al.
International Journal of Immunopathology and Pharmacology|December 21, 2013
Tanshinone VI inhibits the expression of intercellular adhesion molecule-1 and vascular cell adhesion molecule-1V Nicolin, F Bossi, A Viggiano, et al.
The Journal of Chemical Physics|July 23, 2004
Electron attachment to PSCl3W B Knighton, Thomas M Miller, E P Grimsrud, et al.
The Journal of Physical Chemistry. A|March 3, 2006
A study of the reaction of N+ with O2: experimental quantification of NO+(a 3Sigma+) production (298-500 K) and computational study of the overall reaction pathwaysAnthony J Midey, A A Viggiano, Peng Zhang, et al.
The Journal of Chemical Physics|November 7, 2012
Electron attachment to 14 halogenated alkenes and alkanes, 300-600 KNicholas S Shuman, Jeffrey F Friedman, Thomas M Miller, et al.
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