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Aaditya Bhat

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Nano Letters|April 15, 2025
Quantifying Implantation-Induced Damage and Point Defects with Multislice Electron PtychographyJunghwa Kim, Colin Gilgenbach, Aaditya Bhat, et al.
Ultramicroscopy|November 27, 2025
Sensitivity of multislice electron ptychography to point defects: A case study in SiCAaditya Bhat, Colin Gilgenbach, Junghwa Kim, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Nano Letters|April 15, 2025
Quantifying Implantation-Induced Damage and Point Defects with Multislice Electron PtychographyJunghwa Kim, Colin Gilgenbach, Aaditya Bhat, et al.
Ultramicroscopy|November 27, 2025
Sensitivity of multislice electron ptychography to point defects: A case study in SiCAaditya Bhat, Colin Gilgenbach, Junghwa Kim, et al.
Pageof 1