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ACS Applied Materials & Interfaces|August 19, 2020
Single- versus Dual-Ion Conductors for Electric Double Layer Gating: Finite Element Modeling and Hall-Effect MeasurementsAaron Woeppel, Ke Xu, Azimkhan Kozhakhmetov, et al.
ACS Applied Materials & Interfaces|September 6, 2019
Electric Double-Layer Gating of Two-Dimensional Field-Effect Transistors Using a Single-Ion ConductorKe Xu, Jierui Liang, Aaron Woeppel, et al.
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