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Materials (Basel, Switzerland)
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May 14, 2025
Identification of the Influence of IPA Rinsing Times on Surface Roughness of SLA-Printed Parts Made of Different Materials
Wiktor Harmatys, Adam Gąska, Piotr Gąska, et al.
Sensors (Basel, Switzerland)
|
April 30, 2021
Assessment of Background Illumination Influence on Accuracy of Measurements Performed on Optical Coordinate Measuring Machine Equipped with Video Probe
Wiktor Harmatys, Adam Gąska, Piotr Gąska, et al.
Materials (Basel, Switzerland)
|
June 24, 2022
Applicability Assessment of Different Materials for Standards Ensuring Comparability of Optical and Tactile Coordinate Measurements
Wiktor Harmatys, Piotr Gąska, Adam Gąska, et al.
Materials (Basel, Switzerland)
|
August 14, 2025
The Impact of an Object's Surface Material and Preparatory Actions on the Accuracy of Optical Coordinate Measurement
Danuta Owczarek, Ksenia Ostrowska, Jerzy Sładek, et al.
Sensors (Basel, Switzerland)
|
December 31, 2025
Multi-Task Deep Learning for Surface Metrology
Dawid Kucharski, Adam Gąska, Tomasz Kowaluk, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Materials (Basel, Switzerland)
|
May 14, 2025
Identification of the Influence of IPA Rinsing Times on Surface Roughness of SLA-Printed Parts Made of Different Materials
Wiktor Harmatys, Adam Gąska, Piotr Gąska, et al.
Sensors (Basel, Switzerland)
|
April 30, 2021
Assessment of Background Illumination Influence on Accuracy of Measurements Performed on Optical Coordinate Measuring Machine Equipped with Video Probe
Wiktor Harmatys, Adam Gąska, Piotr Gąska, et al.
Materials (Basel, Switzerland)
|
June 24, 2022
Applicability Assessment of Different Materials for Standards Ensuring Comparability of Optical and Tactile Coordinate Measurements
Wiktor Harmatys, Piotr Gąska, Adam Gąska, et al.
Materials (Basel, Switzerland)
|
August 14, 2025
The Impact of an Object's Surface Material and Preparatory Actions on the Accuracy of Optical Coordinate Measurement
Danuta Owczarek, Ksenia Ostrowska, Jerzy Sładek, et al.
Sensors (Basel, Switzerland)
|
December 31, 2025
Multi-Task Deep Learning for Surface Metrology
Dawid Kucharski, Adam Gąska, Tomasz Kowaluk, et al.
Page
of 1