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Science Advances
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June 21, 2023
Thin-film design of amorphous hafnium oxide nanocomposites enabling strong interfacial resistive switching uniformity
Markus Hellenbrand, Babak Bakhit, Hongyi Dou, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
June 30, 2018
Silicon Oxide (SiO<sub>x</sub> ): A Promising Material for Resistance Switching?
Adnan Mehonic, Alexander L Shluger, David Gao, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
June 24, 2016
Nanoscale Transformations in Metastable, Amorphous, Silicon-Rich Silica
Adnan Mehonic, Mark Buckwell, Luca Montesi, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
October 15, 2024
The Role of Hydrogen in ReRAM
Horatio R J Cox, Matthew K Sharpe, Callum McAleese, et al.
Nature Communications
|
March 4, 2024
Hardware implementation of memristor-based artificial neural networks
Fernando Aguirre, Abu Sebastian, Manuel Le Gallo, et al.
ACS Nano
|
November 3, 2021
Standards for the Characterization of Endurance in Resistive Switching Devices
Mario Lanza, Rainer Waser, Daniele Ielmini, et al.
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Search research articles
Search
Showing results (11-20 of 16) with videos related to
Sort By:
Page
of 2
You have reached the last page of results.
This site can display upto 16 results.
Science Advances
|
June 21, 2023
Thin-film design of amorphous hafnium oxide nanocomposites enabling strong interfacial resistive switching uniformity
Markus Hellenbrand, Babak Bakhit, Hongyi Dou, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
June 30, 2018
Silicon Oxide (SiO<sub>x</sub> ): A Promising Material for Resistance Switching?
Adnan Mehonic, Alexander L Shluger, David Gao, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
June 24, 2016
Nanoscale Transformations in Metastable, Amorphous, Silicon-Rich Silica
Adnan Mehonic, Mark Buckwell, Luca Montesi, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
October 15, 2024
The Role of Hydrogen in ReRAM
Horatio R J Cox, Matthew K Sharpe, Callum McAleese, et al.
Nature Communications
|
March 4, 2024
Hardware implementation of memristor-based artificial neural networks
Fernando Aguirre, Abu Sebastian, Manuel Le Gallo, et al.
ACS Nano
|
November 3, 2021
Standards for the Characterization of Endurance in Resistive Switching Devices
Mario Lanza, Rainer Waser, Daniele Ielmini, et al.
Page
of 2