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Optics Express|November 14, 2024
High-speed lateral scanning white-light phase shift interferometryJaeseung Im, Byoung-Woon Ahn, Ah-Jin Jo, et al.
Applied Microscopy|March 8, 2022
Automated measurement and analysis of sidewall roughness using three-dimensional atomic force microscopySu-Been Yoo, Seong-Hun Yun, Ah-Jin Jo, et al.
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