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Ultramicroscopy|March 19, 2013
3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomographyAjay Kumar Kambham, Arul Kumar, Matthieu Gilbert, et al.
Nanotechnology|June 15, 2013
Three-dimensional doping and diffusion in nano scaled devices as studied by atom probe tomographyAjay Kumar Kambham, Arul Kumar, Antonios Florakis, et al.
Ultramicroscopy|March 19, 2013
Atomic insight into Ge₁₋xSnx using atom probe tomographyArul Kumar, Manu P Komalan, Haraprasanna Lenka, et al.
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