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Alan G Jacobs

Showing results (1-10 of 6) with videos related to

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Nano Letters|November 5, 2015
μ-Rainbow: CdSe Nanocrystal Photoluminescence Gradients via Laser Spike Annealing for Kinetic Investigations and Tunable Device DesignBenjamin E Treml, Alan G Jacobs, Robert T Bell, et al.
ACS Applied Materials & Interfaces|June 10, 2017
Ultrafast Self-Assembly of Sub-10 nm Block Copolymer Nanostructures by Solvent-Free High-Temperature Laser AnnealingJing Jiang, Alan G Jacobs, Brandon Wenning, et al.
Scientific Reports|March 29, 2024
Detecting defects that reduce breakdown voltage using machine learning and optical profilometryJames C Gallagher, Michael A Mastro, Alan G Jacobs, et al.
ACS Combinatorial Science|July 8, 2016
Lateral Temperature-Gradient Method for High-Throughput Characterization of Material Processing by Millisecond Laser AnnealingRobert T Bell, Alan G Jacobs, Victoria C Sorg, et al.
Scientific Reports|January 14, 2022
Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniquesJames C Gallagher, Mona A Ebrish, Matthew A Porter, et al.
Scientific Reports|February 27, 2023
Using machine learning with optical profilometry for GaN wafer screeningJames C Gallagher, Michael A Mastro, Mona A Ebrish, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Nano Letters|November 5, 2015
μ-Rainbow: CdSe Nanocrystal Photoluminescence Gradients via Laser Spike Annealing for Kinetic Investigations and Tunable Device DesignBenjamin E Treml, Alan G Jacobs, Robert T Bell, et al.
ACS Applied Materials & Interfaces|June 10, 2017
Ultrafast Self-Assembly of Sub-10 nm Block Copolymer Nanostructures by Solvent-Free High-Temperature Laser AnnealingJing Jiang, Alan G Jacobs, Brandon Wenning, et al.
Scientific Reports|March 29, 2024
Detecting defects that reduce breakdown voltage using machine learning and optical profilometryJames C Gallagher, Michael A Mastro, Alan G Jacobs, et al.
ACS Combinatorial Science|July 8, 2016
Lateral Temperature-Gradient Method for High-Throughput Characterization of Material Processing by Millisecond Laser AnnealingRobert T Bell, Alan G Jacobs, Victoria C Sorg, et al.
Scientific Reports|January 14, 2022
Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniquesJames C Gallagher, Mona A Ebrish, Matthew A Porter, et al.
Scientific Reports|February 27, 2023
Using machine learning with optical profilometry for GaN wafer screeningJames C Gallagher, Michael A Mastro, Mona A Ebrish, et al.
Pageof 1