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Optics Letters
|
December 16, 2014
Ultra-thin curved transmission crystals for high resolving power (up to E/ΔE = 6300) x-ray spectroscopy in the 6-13 keV energy range
John F Seely, Lawrence T Hudson, Jack L Glover, et al.
Journal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal
|
February 28, 2020
The Molybdenum K-shell X-ray Emission Spectrum
Marcus H Mendenhall, Lawrence T Hudson, Csilla I Szabo, et al.
Journal of Research of the National Institute of Standards and Technology
|
March 12, 2024
The NIST Vacuum Double-Crystal Spectrometer: A Tool for SI-Traceable Measurement of X-Ray Emission Spectra
Csilla I Szabo, James P Cline, Albert Henins, et al.
Journal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal
|
August 1, 2017
High-precision measurement of the X-ray Cu K<i>α</i> spectrum
Marcus H Mendenhall, Albert Henins, Lawrence T Hudson, et al.
Powder Diffraction
|
December 14, 2020
Certification of Standard Reference Material 660c for powder diffraction
David R Black, Marcus H Mendenhall, Craig M Brown, et al.
Powder Diffraction
|
April 19, 2019
Certification of Standard Reference Material 1879b Respirable Cristobalite
David R Black, Marcus H Mendenhall, Pamela S Whitfield, et al.
Journal of Research of the National Institute of Standards and Technology
|
December 8, 2021
The Lattice Spacing Variability of Intrinsic Float-Zone Silicon
Ernest G Kessler, Csilla I Szabo, James P Cline, et al.
Journal of Research of the National Institute of Standards and Technology
|
July 31, 2024
The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size Analysis
James P Cline, Marcus H Mendenhall, Joseph J Ritter, et al.
Science (New York, N.Y.)
|
September 13, 2021
Pendellösung interferometry probes the neutron charge radius, lattice dynamics, and fifth forces
Benjamin Heacock, Takuhiro Fujiie, Robert W Haun, et al.
The Review of Scientific Instruments
|
November 29, 2014
Measurement of high-energy (10-60 keV) x-ray spectral line widths with eV accuracy
J F Seely, J L Glover, L T Hudson, et al.
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Showing results (11-20 of 20) with videos related to
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This site can display upto 20 results.
Optics Letters
|
December 16, 2014
Ultra-thin curved transmission crystals for high resolving power (up to E/ΔE = 6300) x-ray spectroscopy in the 6-13 keV energy range
John F Seely, Lawrence T Hudson, Jack L Glover, et al.
Journal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal
|
February 28, 2020
The Molybdenum K-shell X-ray Emission Spectrum
Marcus H Mendenhall, Lawrence T Hudson, Csilla I Szabo, et al.
Journal of Research of the National Institute of Standards and Technology
|
March 12, 2024
The NIST Vacuum Double-Crystal Spectrometer: A Tool for SI-Traceable Measurement of X-Ray Emission Spectra
Csilla I Szabo, James P Cline, Albert Henins, et al.
Journal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal
|
August 1, 2017
High-precision measurement of the X-ray Cu K<i>α</i> spectrum
Marcus H Mendenhall, Albert Henins, Lawrence T Hudson, et al.
Powder Diffraction
|
December 14, 2020
Certification of Standard Reference Material 660c for powder diffraction
David R Black, Marcus H Mendenhall, Craig M Brown, et al.
Powder Diffraction
|
April 19, 2019
Certification of Standard Reference Material 1879b Respirable Cristobalite
David R Black, Marcus H Mendenhall, Pamela S Whitfield, et al.
Journal of Research of the National Institute of Standards and Technology
|
December 8, 2021
The Lattice Spacing Variability of Intrinsic Float-Zone Silicon
Ernest G Kessler, Csilla I Szabo, James P Cline, et al.
Journal of Research of the National Institute of Standards and Technology
|
July 31, 2024
The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size Analysis
James P Cline, Marcus H Mendenhall, Joseph J Ritter, et al.
Science (New York, N.Y.)
|
September 13, 2021
Pendellösung interferometry probes the neutron charge radius, lattice dynamics, and fifth forces
Benjamin Heacock, Takuhiro Fujiie, Robert W Haun, et al.
The Review of Scientific Instruments
|
November 29, 2014
Measurement of high-energy (10-60 keV) x-ray spectral line widths with eV accuracy
J F Seely, J L Glover, L T Hudson, et al.
Page
of 2