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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 17, 2009
X-ray microanalysis combined with monte carlo simulation for the analysis of layered thin films: the case of carbon contaminationAldo Armigliato, Rodolfo RosaMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 18, 2006
Quantitative thin-film x-ray microanalysis by STEM/HAADF: statistical analysis for precision and accuracy determinationAldo Armigliato, Roberto Balboni, Rodolfo RosaJournal of Microscopy|October 4, 2007
Application of the parametric bootstrap method to determine statistical errors in quantitative X-ray microanalysis of thin filmsAldo Armigliato, Roberto Balboni, Rodolfo RosaMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 5, 2013
FIB preparation of a NiO Wedge-Lamella and STEM X-ray microanalysis for the determination of the experimental k(O-Ni) Cliff-Lorimer coefficientAldo Armigliato, Stefano Frabboni, Gian Carlo Gazzadi, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 1, 2018
Comparison of Cliff-Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin FilmsAndrea Parisini, Stefano Frabboni, Gian Carlo Gazzadi, et al.Pageof 1