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RSC Advances|April 15, 2022
Influence of low Bi contents on phase transformation properties of VO2 studied in a VO2:Bi thin film libraryXiao Wang, Detlef Rogalla, Aleksander Kostka, et al.
ACS Combinatorial Science|August 1, 2017
Shape Memory Micro- and Nanowire Libraries for the High-Throughput Investigation of Scaling EffectsTobias Oellers, Dennis König, Aleksander Kostka, et al.
Ultramicroscopy|December 15, 2010
Thermal stability of TiAlN/CrN multilayer coatings studied by atom probe tomographyPyuck-Pa Choi, Ivan Povstugar, Jae-Pyeong Ahn, et al.
Data in Brief|November 26, 2019
Data regarding the influence of Al, Ti, and C additions to as-cast Al0.6CoCrFeNi compositionally complex alloys on microstructures and mechanical propertiesAlex Asabre, Janine Pfetzing-Micklich, Oleg Stryzhyboroda, et al.
Materials Horizons|July 24, 2024
Self-formation of compositionally complex surface oxides on high entropy alloys observed by accelerated atom probe tomography: a route to sustainable catalystsValerie Strotkötter, Yujiao Li, Aleksander Kostka, et al.
ACS Applied Materials & Interfaces|October 4, 2014
Sequential growth of zinc oxide nanorod arrays at room temperature via a corrosion process: application in visible light photocatalysisDanish Iqbal, Aleksander Kostka, Asif Bashir, et al.
Physical Review Letters|August 2, 2014
Shear-induced mixing governs codeformation of crystalline-amorphous nanolaminatesWei Guo, Eric A Jägle, Pyuck-Pa Choi, et al.
Faraday Discussions|October 13, 2025
Morphological, structural and compositional evolution of PtPdFeCoNi high-entropy alloy nanoparticles towards bifunctional oxygen electrocatalysisPriya Jain, Pouya Hosseini, Aleksander Kostka, et al.
ACS Applied Materials & Interfaces|July 25, 2019
PEALD of HfO2 Thin Films: Precursor Tuning and a New Near-Ambient-Pressure XPS Approach to in Situ Examination of Thin-Film Surfaces Exposed to Reactive GasesDavid Zanders, Engin Ciftyurek, Ersoy Subaşı, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 5, 2021
Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi DiffractionJiwon Jeong, Woo-Sung Jang, Kwang Hun Kim, et al.
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