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Alex W Robinson

Showing results (1-10 of 6) with videos related to

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Ultramicroscopy|October 2, 2022
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM SimulationAlex W Robinson, Daniel Nicholls, Jack Wells, et al.
Optics Express|August 13, 2025
LoRePIE: ℓ<sub>0</sub> regularized extended ptychographical iterative engine for low-dose and fast electron ptychographyAmirafshar Moshtaghpour, Abner Velazco-Torrejon, Alex W Robinson, et al.
Journal of Microscopy|August 21, 2024
Diffusion distribution model for damage mitigation in scanning transmission electron microscopyAmirafshar Moshtaghpour, Abner Velazco-Torrejon, Daniel Nicholls, et al.
Journal of Microscopy|February 17, 2023
Towards real-time STEM simulations through targeted subsampling strategiesAlex W Robinson, Jack Wells, Daniel Nicholls, et al.
Journal of Microscopy|January 11, 2025
Compressive electron backscatter diffraction imagingZoë Broad, Alex W Robinson, Jack Wells, et al.
Journal of Microscopy|May 7, 2024
High-speed 4-dimensional scanning transmission electron microscopy using compressive sensing techniquesAlex W Robinson, Amirafshar Moshtaghpour, Jack Wells, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|October 2, 2022
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM SimulationAlex W Robinson, Daniel Nicholls, Jack Wells, et al.
Optics Express|August 13, 2025
LoRePIE: ℓ<sub>0</sub> regularized extended ptychographical iterative engine for low-dose and fast electron ptychographyAmirafshar Moshtaghpour, Abner Velazco-Torrejon, Alex W Robinson, et al.
Journal of Microscopy|August 21, 2024
Diffusion distribution model for damage mitigation in scanning transmission electron microscopyAmirafshar Moshtaghpour, Abner Velazco-Torrejon, Daniel Nicholls, et al.
Journal of Microscopy|February 17, 2023
Towards real-time STEM simulations through targeted subsampling strategiesAlex W Robinson, Jack Wells, Daniel Nicholls, et al.
Journal of Microscopy|January 11, 2025
Compressive electron backscatter diffraction imagingZoë Broad, Alex W Robinson, Jack Wells, et al.
Journal of Microscopy|May 7, 2024
High-speed 4-dimensional scanning transmission electron microscopy using compressive sensing techniquesAlex W Robinson, Amirafshar Moshtaghpour, Jack Wells, et al.
Pageof 1