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Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry|January 31, 2012
Organic-organic heterostructures: concepts and applicationsAlexander Hinderhofer, Frank Schreiber
The Journal of Physical Chemistry. A|July 20, 2019
Revealing Suppressed Intermolecular Coupling Effects in Aggregated Organic Semiconductors by Diluting the Crystal: Model System Perfluoropentacene:PiceneJohannes Dieterle, Katharina Broch, Alexander Hinderhofer, et al.
Science Advances|March 14, 2025
Fast and reliable probabilistic reflectometry inversion with prior-amortized neural posterior estimationVladimir Starostin, Maximilian Dax, Alexander Gerlach, et al.
The Review of Scientific Instruments|May 8, 2025
Vacuum chamber for deposition of gradient thin films: Toward high-throughput structure-property correlative studiesDmitry Lapkin, Roody Nasro, Jakub Hagara, et al.
Journal of Applied Crystallography|February 13, 2023
Machine learning for scattering data: strategies, perspectives and applications to surface scatteringAlexander Hinderhofer, Alessandro Greco, Vladimir Starostin, et al.
The Journal of Physical Chemistry Letters|February 16, 2019
Template-Free Orientation Selection of Rod-Like Molecular Semiconductors in Polycrystalline FilmsGiuliano Duva, Alexander Mann, Linus Pithan, et al.
Physical Chemistry Chemical Physics : PCCP|October 9, 2009
Role of the substrate in electronic structure, molecular orientation, and morphology of organic thin films: diindenoperylene on rutile TiO2(110)Britt-Elfriede Schuster, M Benedetta Casu, Indro Biswas, et al.
Physical Chemistry Chemical Physics : PCCP|August 1, 2019
Ground-state charge-transfer interactions in donor:acceptor pairs of organic semiconductors - a spectroscopic study of two representative systemsGiuliano Duva, Paul Beyer, Reinhard Scholz, et al.
Science (New York, N.Y.)|October 4, 2017
Perovskite solar cells with CuSCN hole extraction layers yield stabilized efficiencies greater than 20Neha Arora, M Ibrahim Dar, Alexander Hinderhofer, et al.
Journal of Applied Crystallography|April 10, 2024
Neural network analysis of neutron and X-ray reflectivity data incorporating prior knowledgeValentin Munteanu, Vladimir Starostin, Alessandro Greco, et al.
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