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The Review of Scientific Instruments|February 1, 2016

Characterizing nanoscale scanning probes using electron microscopy: A novel fixture and a practical guideTevis D B Jacobs, Graham E Wabiszewski, Alexander J Goodman, et al.

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The Review of Scientific Instruments|February 1, 2016

Characterizing nanoscale scanning probes using electron microscopy: A novel fixture and a practical guideTevis D B Jacobs, Graham E Wabiszewski, Alexander J Goodman, et al.

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