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Nano Letters
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November 3, 2018
Defect Manipulation To Control ZnO Micro-/Nanowire-Metal Contacts
Jonathan W Cox, Geoffrey M Foster, Alexander Jarjour, et al.
Nature Communications
|
August 22, 2020
Magnetic field detection limits for ultraclean graphene Hall sensors
Brian T Schaefer, Lei Wang, Alexander Jarjour, et al.
Nature Communications
|
January 19, 2021
Publisher Correction: Magnetic field detection limits for ultraclean graphene Hall sensors
Brian T Schaefer, Lei Wang, Alexander Jarjour, et al.
Nature Communications
|
April 12, 2023
Superfluid response of an atomically thin gate-tuned van der Waals superconductor
Alexander Jarjour, G M Ferguson, Brian T Schaefer, et al.
The Review of Scientific Instruments
|
September 2, 2021
Scanning SQUID microscopy in a cryogen-free dilution refrigerator
D Low, G M Ferguson, Alexander Jarjour, et al.
Materials (Basel, Switzerland)
|
July 25, 2019
Native Point Defect Measurement and Manipulation in ZnO Nanostructures
Leonard Brillson, Jonathan Cox, Hantian Gao, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 6) with videos related to
Sort By:
Page
of 1
Nano Letters
|
November 3, 2018
Defect Manipulation To Control ZnO Micro-/Nanowire-Metal Contacts
Jonathan W Cox, Geoffrey M Foster, Alexander Jarjour, et al.
Nature Communications
|
August 22, 2020
Magnetic field detection limits for ultraclean graphene Hall sensors
Brian T Schaefer, Lei Wang, Alexander Jarjour, et al.
Nature Communications
|
January 19, 2021
Publisher Correction: Magnetic field detection limits for ultraclean graphene Hall sensors
Brian T Schaefer, Lei Wang, Alexander Jarjour, et al.
Nature Communications
|
April 12, 2023
Superfluid response of an atomically thin gate-tuned van der Waals superconductor
Alexander Jarjour, G M Ferguson, Brian T Schaefer, et al.
The Review of Scientific Instruments
|
September 2, 2021
Scanning SQUID microscopy in a cryogen-free dilution refrigerator
D Low, G M Ferguson, Alexander Jarjour, et al.
Materials (Basel, Switzerland)
|
July 25, 2019
Native Point Defect Measurement and Manipulation in ZnO Nanostructures
Leonard Brillson, Jonathan Cox, Hantian Gao, et al.
Page
of 1