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Optics Express|July 1, 2011
Contact-free fault location and imaging with on-chip terahertz time-domain reflectometryMichael Nagel, Alexander Michalski, Heinrich Kurz
International Journal of Pharmaceutics|November 25, 2024
Sparse-deconvolution terahertz near-field microprobe tomography enabling non-destructive inspection of small solid dosage formsMatthias Wolfgang, Alexander Michalski, Simon Sawallich, et al.
Nano Letters|March 12, 2026
On-Chip THz-TDS Platform for High-Sensitivity Analysis of Graphene and Thin-Film ConductorsJimin Lee, Alexander Michalski, Simon Sawallich, et al.
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