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Science (New York, N.Y.)|May 3, 2008
Dislocation-driven nanowire growth and Eshelby twistMatthew J Bierman, Y K Albert Lau, Alexander V Kvit, et al.
ACS Applied Materials & Interfaces|January 4, 2014
Cl-doped ZnO nanowires with metallic conductivity and their application for high-performance photoelectrochemical electrodesFei Wang, Jung-Hun Seo, Zhaodong Li, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 27, 2014
Thickness variations and absence of lateral compositional fluctuations in aberration-corrected STEM images of InGaN LED active regions at low doseAndrew B Yankovich, Alexander V Kvit, Xing Li, et al.
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