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Alexander von Finck

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Applied Optics|April 5, 2011
Instrument for close-to-process light scatter measurements of thin film coatings and substratesAlexander von Finck, Matthias Hauptvogel, Angela Duparré
Applied Optics|February 12, 2014
Characterization of optical coatings using a multisource table-top scatterometerAlexander von Finck, Tobias Herffurth, Sven Schröder, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Applied Optics|April 5, 2011
Instrument for close-to-process light scatter measurements of thin film coatings and substratesAlexander von Finck, Matthias Hauptvogel, Angela Duparré
Applied Optics|February 12, 2014
Characterization of optical coatings using a multisource table-top scatterometerAlexander von Finck, Tobias Herffurth, Sven Schröder, et al.
Pageof 1