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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 18, 2003
Charge-related problems associated with X-ray microanalysis in the variable pressure scanning electron microscope at low pressuresBrendan J Griffin, Alexandra A SuvorovaJournal of Nanoscience and Nanotechnology|February 21, 2013
Optical properties of silicon semiconductor-supported gold nanoparticles obtained by sputteringMaria M Giangregorio, Giuseppe V Bianco, Pio Capezzuto, et al.Nano Letters|April 13, 2006
Influence of nanowire density on the shape and optical properties of ternary InGaAs nanowiresYong Kim, Hannah J Joyce, Qiang Gao, et al.Pageof 1