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Alon Eisenstein

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The Review of Scientific Instruments|April 3, 2012

Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tipsAlon Eisenstein, M Cynthia Goh

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Search research articles

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The Review of Scientific Instruments|April 3, 2012

Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tipsAlon Eisenstein, M Cynthia Goh

Pageof 1