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Beilstein Journal of Nanotechnology|October 7, 2011
Kinetic lattice Monte-Carlo simulations on the ordering kinetics of free and supported FePt L1(0)-nanoparticlesMichael Müller, Karsten Albe
Beilstein Journal of Nanotechnology|November 9, 2013
Plasticity of nanocrystalline alloys with chemical order: on the strength and ductility of nanocrystalline Ni-FeJonathan Schäfer, Karsten Albe
Acta Crystallographica. Section A, Foundations of Crystallography|December 24, 2002
Structure and stability of alpha- and beta-Ti2Se. Electron diffraction versus density-functional theory calculationsKarsten Albe, Thomas E Weirich
Beilstein Journal of Nanotechnology|March 20, 2012
Size-dependent phase diagrams of metallic alloys: A Monte Carlo simulation study on order-disorder transitions in Pt-Rh nanoparticlesJohan Pohl, Christian Stahl, Karsten Albe
Dalton Transactions (Cambridge, England : 2003)|July 14, 2020
Experimental and theoretical investigation of the chemical exfoliation of Cr-based MAX phase particlesMinh Hai Tran, Ali M Malik, Michael Dürrschnabel, et al.
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry|June 26, 2012
Size-dependent lattice expansion in nanoparticles: reality or anomaly?P Manuel Diehm, Péter Ágoston, Karsten Albe
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry|September 25, 2014
Structure sensitivity in the decomposition of ethylene carbonate on Si anodesJochen Rohrer, Payam Kaghazchi
Nanoscale|April 30, 2021
Semi-analytical approach to transport gaps in polycrystalline grapheneDelwin Perera, Jochen Rohrer
Journal of Physics. Condensed Matter : an Institute of Physics Journal|March 10, 2011
Understanding adhesion at as-deposited interfaces from ab initio thermodynamics of deposition growth: thin-film alumina on titanium carbideJochen Rohrer, Per Hyldgaard
Journal of Physics. Condensed Matter : an Institute of Physics Journal|June 23, 2011
Geometry, electronic structure and thermodynamic stability of intrinsic point defects in indium oxidePéter Agoston, Paul Erhart, Andreas Klein, et al.
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