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Anand H S Iyer

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Journal of Synchrotron Radiation|August 6, 2024
In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy. CorrigendumGudrun Lotze, Anand H S Iyer, Olof Bäcke, et al.
Journal of Synchrotron Radiation|December 14, 2023
In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopyGudrun Lotze, Anand H S Iyer, Olof Bäcke, et al.
Physical Review Letters|October 22, 2021
Imaging Ultrafast Dynamical Diffraction Wave Fronts in Strained Si with Coherent X RaysAngel Rodriguez-Fernandez, Ana Diaz, Anand H S Iyer, et al.
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Showing results (1-10 of 3) with videos related to

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Pageof 1
Journal of Synchrotron Radiation|August 6, 2024
In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy. CorrigendumGudrun Lotze, Anand H S Iyer, Olof Bäcke, et al.
Journal of Synchrotron Radiation|December 14, 2023
In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopyGudrun Lotze, Anand H S Iyer, Olof Bäcke, et al.
Physical Review Letters|October 22, 2021
Imaging Ultrafast Dynamical Diffraction Wave Fronts in Strained Si with Coherent X RaysAngel Rodriguez-Fernandez, Ana Diaz, Anand H S Iyer, et al.
Pageof 1