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Andras E Vladar

Showing results (1-10 of 6) with videos related to

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Journal of Research of the National Institute of Standards and Technology|January 6, 2017
Interlaboratory Study on the Lithographically Produced Scanning Electron Microscope Magnification Standard PrototypeMichael T Postek, Andras E Vladar, Samuel N Jones, et al.
Measurement Science & Technology|May 17, 2019
Nondestructive shape process monitoring of three-dimensional high aspect ratio targets using through-focus scanning optical microscopyRavi Kiran Attota, Hyeonggon Kang, Keana Scott, et al.
Journal of Research of the National Institute of Standards and Technology|January 6, 2017
X-Ray Lithography Mask Metrology: Use of Transmitted Electrons in an SEM for Linewidth MeasurementMichael T Postek, Jeremiah R Lowney, Andras E Vladar, et al.
ACS Applied Materials & Interfaces|December 17, 2020
Probing Electrified Liquid-Solid Interfaces with Scanning Electron MicroscopyHongxuan Guo, Alexander Yulaev, Evgheni Strelcov, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 12, 2026
Using a 4-Megapixel Hybrid Photon Counting Detector for Fast, Laboratory-Based Nanoscale X-Ray TomographyJordan Fonseca, Zachary H Levine, Joseph W Fowler, et al.
Journal of Research of the National Institute of Standards and Technology|October 3, 2024
Disinfection of Respirators with Ultraviolet RadiationDianne L Poster, Matthew Hardwick, C Cameron Miller, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Journal of Research of the National Institute of Standards and Technology|January 6, 2017
Interlaboratory Study on the Lithographically Produced Scanning Electron Microscope Magnification Standard PrototypeMichael T Postek, Andras E Vladar, Samuel N Jones, et al.
Measurement Science & Technology|May 17, 2019
Nondestructive shape process monitoring of three-dimensional high aspect ratio targets using through-focus scanning optical microscopyRavi Kiran Attota, Hyeonggon Kang, Keana Scott, et al.
Journal of Research of the National Institute of Standards and Technology|January 6, 2017
X-Ray Lithography Mask Metrology: Use of Transmitted Electrons in an SEM for Linewidth MeasurementMichael T Postek, Jeremiah R Lowney, Andras E Vladar, et al.
ACS Applied Materials & Interfaces|December 17, 2020
Probing Electrified Liquid-Solid Interfaces with Scanning Electron MicroscopyHongxuan Guo, Alexander Yulaev, Evgheni Strelcov, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 12, 2026
Using a 4-Megapixel Hybrid Photon Counting Detector for Fast, Laboratory-Based Nanoscale X-Ray TomographyJordan Fonseca, Zachary H Levine, Joseph W Fowler, et al.
Journal of Research of the National Institute of Standards and Technology|October 3, 2024
Disinfection of Respirators with Ultraviolet RadiationDianne L Poster, Matthew Hardwick, C Cameron Miller, et al.
Pageof 1