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Ultramicroscopy
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November 21, 2016
Experimental evidence concerning the significant information depth of electron backscatter diffraction (EBSD)
Wolfgang Wisniewski, Stefan Saager, Andrea Böbenroth, et al.
Applied Optics
|
March 17, 2026
LIDT measurement routine to assist coating optimization studies of low defect density optics in the nanosecond pulse regime
Alexander Weiß, René Feder, Kevin Kiedrowski, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Ultramicroscopy
|
November 21, 2016
Experimental evidence concerning the significant information depth of electron backscatter diffraction (EBSD)
Wolfgang Wisniewski, Stefan Saager, Andrea Böbenroth, et al.
Applied Optics
|
March 17, 2026
LIDT measurement routine to assist coating optimization studies of low defect density optics in the nanosecond pulse regime
Alexander Weiß, René Feder, Kevin Kiedrowski, et al.
Page
of 1