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Andreas Heile

Showing results (1-10 of 5) with videos related to

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Analytical Chemistry|July 18, 2008
Effects of metal nanoparticles on the secondary ion yields of a model alkane molecule upon atomic and polyatomic projectiles in secondary ion mass spectrometryNimer Wehbe, Andreas Heile, Heinrich F Arlinghaus, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|January 23, 2010
Carbohydrate microarrays by microcontact printingChristian Wendeln, Andreas Heile, Heinrich F Arlinghaus, et al.
Analytical and Bioanalytical Chemistry|February 26, 2009
TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodologyRoel De Mondt, Luc Van Vaeck, Andreas Heile, et al.
Journal of Separation Science|September 19, 2007
Comparative TOF-SIMS and MALDI TOF-MS analysis on different chromatographic planar substratesIvan Talian, Andrej Orinák, Jan Preisler, et al.
Rapid Communications in Mass Spectrometry : RCM|April 11, 2008
Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ionsRoel De Mondt, Luc Van Vaeck, Andreas Heile, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Analytical Chemistry|July 18, 2008
Effects of metal nanoparticles on the secondary ion yields of a model alkane molecule upon atomic and polyatomic projectiles in secondary ion mass spectrometryNimer Wehbe, Andreas Heile, Heinrich F Arlinghaus, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|January 23, 2010
Carbohydrate microarrays by microcontact printingChristian Wendeln, Andreas Heile, Heinrich F Arlinghaus, et al.
Analytical and Bioanalytical Chemistry|February 26, 2009
TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodologyRoel De Mondt, Luc Van Vaeck, Andreas Heile, et al.
Journal of Separation Science|September 19, 2007
Comparative TOF-SIMS and MALDI TOF-MS analysis on different chromatographic planar substratesIvan Talian, Andrej Orinák, Jan Preisler, et al.
Rapid Communications in Mass Spectrometry : RCM|April 11, 2008
Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ionsRoel De Mondt, Luc Van Vaeck, Andreas Heile, et al.
Pageof 1