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Analytical Chemistry
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July 18, 2008
Effects of metal nanoparticles on the secondary ion yields of a model alkane molecule upon atomic and polyatomic projectiles in secondary ion mass spectrometry
Nimer Wehbe, Andreas Heile, Heinrich F Arlinghaus, et al.
Langmuir : the ACS Journal of Surfaces and Colloids
|
January 23, 2010
Carbohydrate microarrays by microcontact printing
Christian Wendeln, Andreas Heile, Heinrich F Arlinghaus, et al.
Analytical and Bioanalytical Chemistry
|
February 26, 2009
TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology
Roel De Mondt, Luc Van Vaeck, Andreas Heile, et al.
Journal of Separation Science
|
September 19, 2007
Comparative TOF-SIMS and MALDI TOF-MS analysis on different chromatographic planar substrates
Ivan Talian, Andrej Orinák, Jan Preisler, et al.
Rapid Communications in Mass Spectrometry : RCM
|
April 11, 2008
Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions
Roel De Mondt, Luc Van Vaeck, Andreas Heile, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Analytical Chemistry
|
July 18, 2008
Effects of metal nanoparticles on the secondary ion yields of a model alkane molecule upon atomic and polyatomic projectiles in secondary ion mass spectrometry
Nimer Wehbe, Andreas Heile, Heinrich F Arlinghaus, et al.
Langmuir : the ACS Journal of Surfaces and Colloids
|
January 23, 2010
Carbohydrate microarrays by microcontact printing
Christian Wendeln, Andreas Heile, Heinrich F Arlinghaus, et al.
Analytical and Bioanalytical Chemistry
|
February 26, 2009
TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology
Roel De Mondt, Luc Van Vaeck, Andreas Heile, et al.
Journal of Separation Science
|
September 19, 2007
Comparative TOF-SIMS and MALDI TOF-MS analysis on different chromatographic planar substrates
Ivan Talian, Andrej Orinák, Jan Preisler, et al.
Rapid Communications in Mass Spectrometry : RCM
|
April 11, 2008
Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions
Roel De Mondt, Luc Van Vaeck, Andreas Heile, et al.
Page
of 1