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Anthony Brockwell

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IEEE Transactions on Pattern Analysis and Machine Intelligence|February 15, 2007
Statistical performance evaluation of biometric authentication systems using random effects modelsSinjini Mitra, Marios Savvides, Anthony Brockwell
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IEEE Transactions on Pattern Analysis and Machine Intelligence|February 15, 2007
Statistical performance evaluation of biometric authentication systems using random effects modelsSinjini Mitra, Marios Savvides, Anthony Brockwell
Pageof 1