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Anthony G Fowler

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The Review of Scientific Instruments|May 3, 2015
Note: A silicon-on-insulator microelectromechanical systems probe scanner for on-chip atomic force microscopyAnthony G Fowler, Mohammad Maroufi, S O Reza Moheimani
The Review of Scientific Instruments|March 2, 2015
High-stroke silicon-on-insulator MEMS nanopositioner: control design for non-raster scan atomic force microscopyMohammad Maroufi, Anthony G Fowler, Ali Bazaei, et al.
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Showing results (1-10 of 2) with videos related to

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Pageof 1
The Review of Scientific Instruments|May 3, 2015
Note: A silicon-on-insulator microelectromechanical systems probe scanner for on-chip atomic force microscopyAnthony G Fowler, Mohammad Maroufi, S O Reza Moheimani
The Review of Scientific Instruments|March 2, 2015
High-stroke silicon-on-insulator MEMS nanopositioner: control design for non-raster scan atomic force microscopyMohammad Maroufi, Anthony G Fowler, Ali Bazaei, et al.
Pageof 1