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Antonio C L Lino

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Applied Optics|April 21, 2007
Multiwavelength electronic speckle pattern interferometry for surface shape measurementEduardo A Barbosa, Antonio C L Lino
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Applied Optics|April 21, 2007
Multiwavelength electronic speckle pattern interferometry for surface shape measurementEduardo A Barbosa, Antonio C L Lino
Pageof 1