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Ultramicroscopy
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July 17, 2012
A holographic method to measure the source size broadening in STEM
Jo Verbeeck, Armand Béché, Wouter Van den Broek
Micron (Oxford, England : 1993)
|
November 26, 2015
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope
David Cooper, Thibaud Denneulin, Nicolas Bernier, et al.
Nature Communications
|
April 14, 2019
Asymmetry and non-dispersivity in the Aharonov-Bohm effect
Maria Becker, Giulio Guzzinati, Armand Béché, et al.
Ultramicroscopy
|
December 3, 2014
Prospects for versatile phase manipulation in the TEM: beyond aberration correction
Giulio Guzzinati, Laura Clark, Armand Béché, et al.
Nature Communications
|
April 13, 2017
Probing the symmetry of the potential of localized surface plasmon resonances with phase-shaped electron beams
Giulio Guzzinati, Armand Béché, Hugo Lourenço-Martins, et al.
Ultramicroscopy
|
December 15, 2020
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges
Hans Vanrompay, Alexander Skorikov, Eva Bladt, et al.
Nano Letters
|
October 15, 2011
Chemical transformation of Au-tipped CdS nanorods into AuS/Cd core/shell particles by electron beam irradiation
Marijn A van Huis, Albert Figuerola, Changming Fang, et al.
Ultramicroscopy
|
April 25, 2018
Demonstration of a 2 × 2 programmable phase plate for electrons
Jo Verbeeck, Armand Béché, Knut Müller-Caspary, et al.
Physical Review Letters
|
March 2, 2019
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy
Sandra Van Aert, Annick De Backer, Lewys Jones, et al.
Nature Communications
|
March 24, 2017
Iron minerals within specific microfossil morphospecies of the 1.88 Ga Gunflint Formation
Kevin Lepot, Ahmed Addad, Andrew H Knoll, et al.
Page
of 3
Search research articles
Search
Showing results (1-10 of 22) with videos related to
Sort By:
Page
of 3
Ultramicroscopy
|
July 17, 2012
A holographic method to measure the source size broadening in STEM
Jo Verbeeck, Armand Béché, Wouter Van den Broek
Micron (Oxford, England : 1993)
|
November 26, 2015
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope
David Cooper, Thibaud Denneulin, Nicolas Bernier, et al.
Nature Communications
|
April 14, 2019
Asymmetry and non-dispersivity in the Aharonov-Bohm effect
Maria Becker, Giulio Guzzinati, Armand Béché, et al.
Ultramicroscopy
|
December 3, 2014
Prospects for versatile phase manipulation in the TEM: beyond aberration correction
Giulio Guzzinati, Laura Clark, Armand Béché, et al.
Nature Communications
|
April 13, 2017
Probing the symmetry of the potential of localized surface plasmon resonances with phase-shaped electron beams
Giulio Guzzinati, Armand Béché, Hugo Lourenço-Martins, et al.
Ultramicroscopy
|
December 15, 2020
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges
Hans Vanrompay, Alexander Skorikov, Eva Bladt, et al.
Nano Letters
|
October 15, 2011
Chemical transformation of Au-tipped CdS nanorods into AuS/Cd core/shell particles by electron beam irradiation
Marijn A van Huis, Albert Figuerola, Changming Fang, et al.
Ultramicroscopy
|
April 25, 2018
Demonstration of a 2 × 2 programmable phase plate for electrons
Jo Verbeeck, Armand Béché, Knut Müller-Caspary, et al.
Physical Review Letters
|
March 2, 2019
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy
Sandra Van Aert, Annick De Backer, Lewys Jones, et al.
Nature Communications
|
March 24, 2017
Iron minerals within specific microfossil morphospecies of the 1.88 Ga Gunflint Formation
Kevin Lepot, Ahmed Addad, Andrew H Knoll, et al.
Page
of 3